XMaS beamline experiments test new measurement technique Scientists from NPL, the XMaS beamline and the I16 beamline at Diamond Light Source Ltd have carried out the first experiments using a new technique to measure crystallographic lattice parameters and their distribution (intrinsic strain) in thin film heterostructures.… Read More
Nanostrain at ALTECH 2014 The Nanostrain project was well represented at the ALTECH symposium of the 2014 European Materials Research Society (EMRS) Spring Meeting, held in Lille, France from the 26th-30th May.… Read More
Preparing piezoelectric samples In January BAM, the German Federal Institute for Materials Research and Testing, hosted a one-day workshop to give Nanostrain project partners first hand experience of preparing thin lamellae from the piezoelectric materials for the Nanostrain project.… Read More
Scanning vibormeter could correct errors in piezoelectric thickening measurements Scientists at the National Physical Laboratory have published details of plans for a new scanning vibrometer to correct decades of errors in the characterising of piezoelectric films.… Read More
